8.7 Physically unclonable function for secure key generation with a key error rate of 2E-38 in 45nm smart-card chips.
Bohdan KarpinskyyYongki LeeYunhyeok ChoiYongsoo KimMijung NohSanghyun LeePublished in: ISSCC (2016)
Keyphrases
- error rate
- smart card
- secure communication
- security requirements
- authentication scheme
- remote user authentication scheme
- security analysis
- digital signature
- authentication protocol
- security mechanisms
- test set
- secret key
- sensitive data
- password authentication
- information security
- java card
- key exchange protocol
- false discovery rate
- misclassification rate
- integrated circuit
- security issues
- word error rate
- lower error rates
- lightweight
- password guessing
- power analysis
- cost sensitive classification
- text entry
- lower bound
- security model