27.4 Physically Unclonable Function in 28nm FD801 Technology Achieving High Reliability for AEC-Q100 Grade 1 and 1SO26262 ASIL-B.
Yunhyeok ChoiBohdan KarpinskyyKyoung-Moon AhnYongsoo KimSoonkwan KwonJieun ParkYongki LeeMijung NohPublished in: ISSCC (2020)