Jeffery Wyss

Publication Activity (10 Years)

Years Active: 2001-2011
Publications (10 Years): 0

Publications

Giovanni Busatto, D. Bisello, Giuseppe Currò, Piero Giubilato, Francesco Iannuzzo, S. Mattiazzo, D. Pantano, Annunziata Sanseverino, L. Silvestrin, M. Tessaro, Francesco Velardi, Jeffery Wyss
A new test methodology for an exhaustive study of single-event-effects on power MOSFETs. Microelectron. Reliab. 51 (9-11) (2011)
Stefano Bertazzoni, Domenico Di Giovenale, Marcello Salmeri, Arianna Mencattini, Adelio Salsano, M. Florean, Jeffery Wyss, Ricardo Rando, Silvano Lora
Monitoring Methodology for TID Damaging of SDRAM Devices based on Retention Time Analysis. DFT (2004)
Francesco Velardi, Francesco Iannuzzo, Giovanni Busatto, Jeffery Wyss, Annunziata Sanseverino, A. Candelori, Giuseppe Currò, Alessandra Cascio, Ferruccio Frisina
Reliability of Medium Blocking Voltage Power VDMOSFET in Radiation Environment. Microelectron. Reliab. 43 (9-11) (2003)
Francesco Velardi, Francesco Iannuzzo, Giovanni Busatto, Jeffery Wyss, A. Candelori
. Microelectron. Reliab. 43 (4) (2003)
Francesco Velardi, Francesco Iannuzzo, Giovanni Busatto, Jeffery Wyss, A. Kaminksy
The Reliability of New Generation Power MOSFETs in Radiation Environment. Microelectron. Reliab. 42 (9-11) (2002)
Giovanni Busatto, Francesco Iannuzzo, Francesco Velardi, Jeffery Wyss
Non-destructive tester for single event burnout of power diodes. Microelectron. Reliab. 41 (9-10) (2001)