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Non-destructive tester for single event burnout of power diodes.

Giovanni BusattoFrancesco IannuzzoFrancesco VelardiJeffery Wyss
Published in: Microelectron. Reliab. (2001)
Keyphrases
  • power consumption
  • evolutionary algorithm
  • event detection
  • data mining
  • artificial intelligence
  • web services
  • artificial neural networks
  • high density
  • computational power