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The Reliability of New Generation Power MOSFETs in Radiation Environment.
Francesco Velardi
Francesco Iannuzzo
Giovanni Busatto
Jeffery Wyss
A. Kaminksy
Published in:
Microelectron. Reliab. (2002)
Keyphrases
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real time
mobile robot
neural network
x ray
autonomous agents
reliability analysis
databases
case study
evolutionary algorithm
test bed
generation process