A new test methodology for an exhaustive study of single-event-effects on power MOSFETs.

Giovanni Busatto D. Bisello Giuseppe Currò Piero Giubilato Francesco Iannuzzo S. Mattiazzo D. Pantano Annunziata Sanseverino L. Silvestrin M. Tessaro Francesco Velardi Jeffery Wyss

Published in: Microelectron. Reliab. (2011)

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