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Hui-Wen Tsai
Publication Activity (10 Years)
Years Active: 2007-2015
Publications (10 Years): 0
Top Topics
Integrated Circuit
High Voltage
Hardware Description Language
Gallium Arsenide
Top Venues
ECCTD
VLSI-DAT
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Publications
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Hui-Wen Tsai
,
Ming-Dou Ker
Compensation circuit with additional junction sensor to enhance latchup immunity for CMOS integrated circuits.
ECCTD
(2015)
Hui-Wen Tsai
,
Ming-Dou Ker
,
Yi-Sheng Liu
,
Ming-Nan Chuang
Analysis and solution to overcome EOS failure induced by latchup test in a high-voltage integrated circuits.
VLSI-DAT
(2013)
Yi-Hsin Weng
,
Hui-Wen Tsai
,
Ming-Dou Ker
Design to suppress return-back leakage current of charge pump circuit in low-voltage CMOS process.
Microelectron. Reliab.
51 (5) (2011)
Hui-Wen Tsai
,
Ming-Dou Ker
Design of 2xVDD-tolerant mixed-voltage I/O buffer against gate-oxide reliability and hot-carrier degradation.
Microelectron. Reliab.
50 (1) (2010)
Hui-Wen Tsai
,
Ming-Dou Ker
Design of 2�?VDD-Tolerant I/O Buffer with Considerations of Gate-Oxide Reliability and Hot-Carrier Degradation.
ICECS
(2007)