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Design to suppress return-back leakage current of charge pump circuit in low-voltage CMOS process.

Yi-Hsin WengHui-Wen TsaiMing-Dou Ker
Published in: Microelectron. Reliab. (2011)
Keyphrases
  • low voltage
  • design considerations
  • cmos technology
  • leakage current
  • power line
  • high speed
  • digital images
  • design process
  • real time
  • hidden markov models
  • power consumption
  • low power