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Design of 2xVDD-tolerant mixed-voltage I/O buffer against gate-oxide reliability and hot-carrier degradation.

Hui-Wen TsaiMing-Dou Ker
Published in: Microelectron. Reliab. (2010)
Keyphrases
  • input output
  • case study
  • user interface
  • design process
  • design principles
  • room temperature
  • field effect transistors
  • silicon dioxide