Login / Signup
Design of 2xVDD-tolerant mixed-voltage I/O buffer against gate-oxide reliability and hot-carrier degradation.
Hui-Wen Tsai
Ming-Dou Ker
Published in:
Microelectron. Reliab. (2010)
Keyphrases
</>
input output
case study
user interface
design process
design principles
room temperature
field effect transistors
silicon dioxide