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Analysis and solution to overcome EOS failure induced by latchup test in a high-voltage integrated circuits.

Hui-Wen TsaiMing-Dou KerYi-Sheng LiuMing-Nan Chuang
Published in: VLSI-DAT (2013)
Keyphrases
  • integrated circuit
  • high voltage
  • neural network
  • real time
  • reinforcement learning
  • artificial intelligence
  • test data