Daniel Gil-Tomas

Publication Activity (10 Years)

Years Active: 2010-2024
Publications (10 Years): 6

Top Topics

Watermarking Scheme

Error Detection

Top Venues

IEEE Trans. Reliab.

IEEE Trans. Very Large Scale Integr. Syst.

Publications

Daniel Gil-Tomas, Luis J. Saiz-Adalid, Joaquin Gracia-Moran, Juan-Carlos Baraza-Calvo, Pedro J. Gil-Vicente
A Hybrid Technique Based on ECC and Hardened Cells for Tolerating Random Multiple-Bit Upsets in SRAM Arrays. IEEE Access 12 (2024)
Luis J. Saiz-Adalid, Joaquin Gracia-Moran, Daniel Gil-Tomas, Juan-Carlos Baraza-Calvo, Pedro J. Gil-Vicente
Ultrafast Codes for Multiple Adjacent Error Correction and Double Error Detection. IEEE Access 7 (2019)
Joaquin Gracia-Moran, Luis J. Saiz-Adalid, Daniel Gil-Tomas, Pedro J. Gil-Vicente
Improving Error Correction Codes for Multiple-Cell Upsets in Space Applications. IEEE Trans. Very Large Scale Integr. Syst. 26 (10) (2018)
Luis J. Saiz-Adalid, Pedro J. Gil, Juan Carlos Ruiz, Joaquin Gracia-Moran, Daniel Gil-Tomas, Juan-Carlos Baraza-Calvo
Ultrafast Error Correction Codes for Double Error Detection/Correction. EDCC (2016)
Daniel Gil-Tomas, Joaquin Gracia-Moran, Juan-Carlos Baraza-Calvo, Luis J. Saiz-Adalid, Pedro J. Gil-Vicente
Injecting Intermittent Faults for the Dependability Assessment of a Fault-Tolerant Microcomputer System. IEEE Trans. Reliab. 65 (2) (2016)
Luis J. Saiz-Adalid, Pedro J. Gil, Joaquin Gracia-Moran, Daniel Gil-Tomas, Juan-Carlos Baraza-Calvo
Ultrafast Single Error Correction Codes for Protecting Processor Registers. EDCC (2015)
Joaquin Gracia-Moran, Juan-Carlos Baraza-Calvo, Daniel Gil-Tomas, Luis J. Saiz-Adalid, Pedro J. Gil-Vicente
Effects of Intermittent Faults on the Reliability of a Reduced Instruction Set Computing (RISC) Microprocessor. IEEE Trans. Reliab. 63 (1) (2014)
Luis J. Saiz-Adalid, Pedro J. Gil, Juan-Carlos Baraza-Calvo, Juan-Carlos Ruiz-Garcia, Daniel Gil-Tomas, Joaquin Gracia-Moran
Modified Hamming Codes to Enhance Short Burst Error Detection in Semiconductor Memories (Short Paper). EDCC (2014)
Joaquin Gracia-Moran, Daniel Gil-Tomas, Luis J. Saiz-Adalid, Juan-Carlos Baraza-Calvo, Pedro J. Gil-Vicente
Defining a Representative and Low Cost Fault Model Set for Intermittent Faults in Microprocessor Buses. LADC (2013)
Luis J. Saiz-Adalid, Pedro J. Gil-Vicente, Juan-Carlos Ruiz-Garcia, Daniel Gil-Tomas, Juan Carlos Baraza, Joaquin Gracia-Moran
Flexible Unequal Error Control Codes with Selectable Error Detection and Correction Levels. SAFECOMP (2013)
Daniel Gil-Tomas, Joaquin Gracia-Moran, Juan-Carlos Baraza-Calvo, Luis J. Saiz-Adalid, Pedro J. Gil-Vicente
Analyzing the Impact of Intermittent Faults on Microprocessors Applying Fault Injection. IEEE Des. Test 29 (6) (2012)
Daniel Gil-Tomas, Joaquin Gracia-Moran, Juan-Carlos Baraza-Calvo, Luis J. Saiz-Adalid, Pedro J. Gil-Vicente
Studying the effects of intermittent faults on a microcontroller. Microelectron. Reliab. 52 (11) (2012)
Joaquin Gracia-Moran, Daniel Gil-Tomas, Luis J. Saiz-Adalid, Juan Carlos Baraza, Pedro J. Gil-Vicente
Experimental validation of a fault tolerant microcomputer system against intermittent faults. DSN (2010)
Joaquin Gracia-Moran, Daniel Gil-Tomas, Juan Carlos Baraza, Luis J. Saiz-Adalid, Pedro J. Gil-Vicente
Searching Representative and Low Cost Fault Models for Intermittent Faults in Microcontrollers: A Case Study. PRDC (2010)