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A Hybrid Technique Based on ECC and Hardened Cells for Tolerating Random Multiple-Bit Upsets in SRAM Arrays.
Daniel Gil-Tomas
Luis J. Saiz-Adalid
Joaquin Gracia-Moran
Juan-Carlos Baraza-Calvo
Pedro J. Gil-Vicente
Published in:
IEEE Access (2024)
Keyphrases
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random access memory
neural network
power consumption