Login / Signup
Modified Hamming Codes to Enhance Short Burst Error Detection in Semiconductor Memories (Short Paper).
Luis J. Saiz-Adalid
Pedro J. Gil
Juan-Carlos Baraza-Calvo
Juan-Carlos Ruiz-Garcia
Daniel Gil-Tomas
Joaquin Gracia-Moran
Published in:
EDCC (2014)
Keyphrases
</>
error detection
error correction
error recovery
error correcting
error control
data cleansing
error resilient
fault isolation
wireless sensor networks
fault tolerance
artificial intelligence
bit rate
fault tolerant
associative memory