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Dale Meehl
Publication Activity (10 Years)
Years Active: 2006-2017
Publications (10 Years): 1
Top Topics
Image Compression
Test Cases
Physical World
Top Venues
ITC
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Publications
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Krishna Chakravadhanula
,
Vivek Chickermane
,
Paul Cunningham
,
Brian Foutz
,
Dale Meehl
,
Louis Milano
,
Christos Papameletis
,
David Scott
,
Steev Wilcox
Advancing test compression to the physical dimension.
ITC
(2017)
Dale Meehl
,
Bassilios Petrakis
,
Ping Zhang
LBIST/ATPG Technologies for On-Demand Digital Logic Testing in Automotive Circuits.
Asian Test Symposium
(2012)
Brion L. Keller
,
Dale Meehl
,
Anis Uzzaman
,
Richard Billings
A Partially-Exhaustive Gate Transition Fault Model.
Asian Test Symposium
(2009)
Gaurav Bhargava
,
Dale Meehl
,
James Sage
Achieving serendipitous N-detect mark-offs in Multi-Capture-Clock scan patterns.
ITC
(2007)
Sanae Seike
,
Ken Namura
,
Yukio Ohya
,
Anis Uzzaman
,
Shinichi Arima
,
Dale Meehl
,
Vivek Chickermane
,
Azumi Kobayashi
,
Satoshi Tanaka
,
Hiroyuki Adachi
Early Life Cycle Yield Learning for Nanometer Devices Using Volume Yield Diagnostics Analysis.
ATS
(2006)