LBIST/ATPG Technologies for On-Demand Digital Logic Testing in Automotive Circuits.
Dale MeehlBassilios PetrakisPing ZhangPublished in: Asian Test Symposium (2012)
Keyphrases
- logic synthesis
- delay insensitive
- digital media
- digital circuits
- circuit design
- digital technologies
- digital world
- asynchronous circuits
- logic circuits
- digital video library
- predicate logic
- multi valued
- modal logic
- mixed signal
- quantum computing
- automotive industry
- random access memory
- analog vlsi
- chip design
- floating gate
- tunnel diode
- data mining
- neural network
- digital content
- st century
- high speed
- logic programming
- national institute
- artificial intelligence
- high level synthesis
- shift register
- multimedia
- fault models
- digital data
- cloud computing
- test cases
- software testing
- logical framework
- classical logic
- emerging technologies