Login / Signup

Early Life Cycle Yield Learning for Nanometer Devices Using Volume Yield Diagnostics Analysis.

Sanae SeikeKen NamuraYukio OhyaAnis UzzamanShinichi ArimaDale MeehlVivek ChickermaneAzumi KobayashiSatoshi TanakaHiroyuki Adachi
Published in: ATS (2006)
Keyphrases
  • life cycle
  • learning algorithm
  • learning process
  • decision making
  • reinforcement learning
  • concurrent engineering
  • impact analysis