Login / Signup
D. Tedesco
Publication Activity (10 Years)
Years Active: 2015-2018
Publications (10 Years): 5
Top Topics
Subband Decomposition
Experimental Study
Image Enhancement
Short Circuit
Top Venues
Microelectron. Reliab.
</>
Publications
</>
Carmine Abbate
,
Giovanni Busatto
,
S. Mattiazzo
,
Annunziata Sanseverino
,
L. Silvestrin
,
D. Tedesco
,
Francesco Velardi
Progressive drain damage in SiC power MOSFETs exposed to ionizing radiation.
Microelectron. Reliab.
(2018)
Carmine Abbate
,
Giovanni Busatto
,
Annunziata Sanseverino
,
D. Tedesco
,
Francesco Velardi
Failure analysis of 650 V enhancement mode GaN HEMT after short circuit tests.
Microelectron. Reliab.
(2018)
Carmine Abbate
,
Giovanni Busatto
,
Annunziata Sanseverino
,
D. Tedesco
,
Francesco Velardi
Measure of high frequency input impedance to study the instability of power devices in short circuit.
Microelectron. Reliab.
(2018)
Carmine Abbate
,
Giovanni Busatto
,
Annunziata Sanseverino
,
D. Tedesco
,
Francesco Velardi
Experimental study of the instabilities observed in 650 V enhancement mode GaN HEMT during short circuit.
Microelectron. Reliab.
(2017)
Carmine Abbate
,
Giovanni Busatto
,
Francesco Iannuzzo
,
S. Mattiazzo
,
Annunziata Sanseverino
,
L. Silvestrin
,
D. Tedesco
,
Francesco Velardi
Experimental study of Single Event Effects induced by heavy ion irradiation in enhancement mode GaN power HEMT.
Microelectron. Reliab.
55 (9-10) (2015)