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Experimental study of the instabilities observed in 650 V enhancement mode GaN HEMT during short circuit.

Carmine AbbateGiovanni BusattoAnnunziata SanseverinoD. TedescoFrancesco Velardi
Published in: Microelectron. Reliab. (2017)
Keyphrases
  • experimental study
  • short circuit
  • thin film
  • image enhancement
  • image processing
  • image analysis
  • experimental evaluation
  • multi objective
  • real life
  • evolutionary algorithm
  • hidden markov models