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Measure of high frequency input impedance to study the instability of power devices in short circuit.
Carmine Abbate
Giovanni Busatto
Annunziata Sanseverino
D. Tedesco
Francesco Velardi
Published in:
Microelectron. Reliab. (2018)
Keyphrases
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high frequency
low frequency
subband
high resolution
wavelet transform
wavelet coefficients
high frequencies
power consumption
visual quality
similarity measure
multiresolution
wavelet domain
control system
input output
computational complexity
subband decomposition
feature selection