Login / Signup

Progressive drain damage in SiC power MOSFETs exposed to ionizing radiation.

Carmine AbbateGiovanni BusattoS. MattiazzoAnnunziata SanseverinoL. SilvestrinD. TedescoFrancesco Velardi
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • ionizing radiation
  • power consumption
  • low dose
  • computer vision