Côme Rozon

Publication Activity (10 Years)

Years Active: 1992-2013
Publications (10 Years): 0

Top Topics

Bayesian Decision Problems

False Positives

Top Venues

J. Electr. Comput. Eng.

Publications

Farid Moshgelani, Dhamin Al-Khalili, Côme Rozon
Ultra-Low Leakage Arithmetic Circuits Using Symmetric and Asymmetric FinFETs. J. Electr. Comput. Eng. 2013 (2013)
Farid Moshgelani, Dhamin Al-Khalili, Côme Rozon
Ultra low leakage structures for logic circuits using symmetric and asymmetric FinFETs. NEWCAS (2012)
Jacques Laurent Athow, Côme Rozon, Dhamin Al-Khalili, J. M. Pierre Langlois
A CNFET-based characterization framework for digital circuits. ICECS (2011)
Hussam Al-Hertani, Dhamin Al-Khalili, Côme Rozon
UDSM subthreshold leakage model for NMOS transistor stacks. Microelectron. J. 39 (12) (2008)
Donald B. Shaw, Dhamin Al-Khalili, Côme Rozon
Automatic generation of defect injectable VHDL fault models for ASIC standard cell libraries. Integr. 39 (4) (2006)
Hussam Al-Hertani, Dhamin Al-Khalili, Côme Rozon
Accurate Total Static Leakage Current Estimation in Transistor Stacks. AICCSA (2006)
Hussam Al-Hertani, Dhamin Al-Khalili, Côme Rozon
Leakage power dissipation in UDSM logic gates. Circuits, Signals, and Systems (2005)
Donald B. Shaw, Dhamin Al-Khalili, Côme Rozon
IC Bridge Fault Modeling for IP Blocks Using Neural Network-Based VHDL Saboteurs. IEEE Trans. Computers 52 (10) (2003)
Donald B. Shaw, Dhamin Al-Khalili, Côme Rozon
Fault security analysis of CMOS VLSI circuits using defect-injectable VHDL models. Integr. 32 (1-2) (2002)
Donald B. Shaw, Dhamin Al-Khalili, Côme Rozon
Accurate CMOS Bridge Fault Modeling with Neural Network-Based VHDL Saboteurs. ICCAD (2001)
Donald B. Shaw, Dhamin Al-Khalili, Côme Rozon
Deriving accurate ASIC cell fault models for VITAL compliant VHDL simulation. ISCAS (5) (2001)
Saman Adham, Dhamin Al-Khalili, Côme Rozon, Douglas Racz
Comprehensive defect analysis and testability of current-mode logic circuits. ISCAS (2000)
Côme Rozon, Dhamin Al-Khalili, Saman Adham, Douglas Racz
Comparing defect coverage for current-mode logic and CMOS VLSI cells. ICECS (2000)
Jason Coppens, Dhamin Al-Khalili, Côme Rozon
VHDL Modelling and Analysis of Fault Secure Systems. DATE (1998)
Dhamin Al-Khalili, Saman Adham, Côme Rozon, Moazzem Hossain, Douglas Racz
Comprehensive Defect Analysis and Defect Coverage of CMOS Circuits. DFT (1998)
Michael Ogbonna Esonu, Dhamin Al-Khalili, Côme Rozon
Fault Characterization and Testability Analysis of Emitter Coupled Logic and Comparison with CMOS & BiCMOS Circuits. VLSI Design 1 (4) (1994)
Michael Ogbonna Esonu, Dhamin Al-Khalili, Côme Rozon
Fault Characterization and Testability Analysis of Emitter Coupled Logic and Comparison with CMOS & BiCMOS Circuits. ISCAS (1993)
Dhamin Al-Khalili, Côme Rozon, B. Stewart
Testability analysis and fault modeling of BiCMOS circuits. J. Electron. Test. 3 (3) (1992)