Comprehensive Defect Analysis and Defect Coverage of CMOS Circuits.

Dhamin Al-Khalili Saman Adham Côme Rozon Moazzem Hossain Douglas Racz

Published in: DFT (1998)

Keyphrases

high speed
data analysis
databases
real world
information retrieval
image processing
video sequences
sensor networks
quantitative analysis
defect detection
delay insensitive