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Ultra-Low Leakage Arithmetic Circuits Using Symmetric and Asymmetric FinFETs.

Farid MoshgelaniDhamin Al-KhaliliCôme Rozon
Published in: J. Electr. Comput. Eng. (2013)
Keyphrases
  • high speed
  • bayesian decision problems
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  • vlsi circuits
  • neural network
  • learning algorithm
  • false positives
  • decision problems
  • delay insensitive