C. Abouda

Publication Activity (10 Years)

Years Active: 2011-2015
Publications (10 Years): 0

Top Topics

Detailed Descriptions

Transmission Electron Microscopy

Leakage Current

Silicon Dioxide

Top Venues

Microelectron. Reliab.

Publications

Julien Goxe, C. Abouda, Béatrice Vanhuffel
Latent gate oxide defects case studies. Microelectron. Reliab. 55 (9-10) (2015)
P. Besse, K. Abouda, C. Abouda
Identifying electrical mechanisms responsible for functional failures during harsh external ESD and EMC aggression. Microelectron. Reliab. 51 (9-11) (2011)