Julien Goxe

Publication Activity (10 Years)

Years Active: 2013-2015
Publications (10 Years): 2

Top Topics

Thin Film Transistor

Statistical Modeling

Transmission Electron Microscopy

Current Practice

Top Venues

Microelectron. Reliab.

Publications

Julien Goxe, C. Abouda, Béatrice Vanhuffel
Latent gate oxide defects case studies. Microelectron. Reliab. 55 (9-10) (2015)
M. Castignolles, Julien Goxe, R. Martin
Failure analysis on recovering low resistive via in mixed-mode device. Microelectron. Reliab. 55 (9-10) (2015)
Corinne Bergès, Julien Goxe
Benefits of field failure distribution modeling to the failure analysis. Microelectron. Reliab. 53 (9-11) (2013)
Yann Weber, Julien Goxe, M. Castignolles
Detectability of automotive power MOSFET on-resistance failure at high current induced by Wafer Fab process excursion. Microelectron. Reliab. 53 (9-11) (2013)