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Identifying electrical mechanisms responsible for functional failures during harsh external ESD and EMC aggression.
P. Besse
K. Abouda
C. Abouda
Published in:
Microelectron. Reliab. (2011)
Keyphrases
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sensor networks
internal and external
transmission line
mechanisms underlying
data sets
video games
computational models
neural network
information retrieval
expert systems
root cause
low voltage
open distributed systems