Ahmed Awad

Publication Activity (10 Years)

Years Active: 2014-2024
Publications (10 Years): 9

Top Topics

Artificial Bee Colony

Decision Diagrams

Optimization Algorithm

Knowledge Compilation

Top Venues

IEEE Trans. Evol. Comput.

IPSJ Trans. Syst. LSI Des. Methodol.

IEICE Trans. Fundam. Electron. Commun. Comput. Sci.

Publications

Baker Abdalhaq, Amjad Hawash, Ahmed Awad
Diversity enforced Genetic Algorithm (GA) for Binary Decision Diagram (BDD) reordering. Appl. Soft Comput. 155 (2024)
Ahmed Awad, Amjad Hawash, Baker Abdalhaq
A Genetic Algorithm (GA) and Swarm-Based Binary Decision Diagram (BDD) Reordering Optimizer Reinforced With Recent Operators. IEEE Trans. Evol. Comput. 27 (3) (2023)
Baker Abdalhaq, Ahmed Awad, Amjad Hawash
A Swarm based Binary Decision Diagram (BDD) Reordering Optimizer for Reversible Circuit Synthesis. DTIS (2020)
Baker Abdalhaq, Ahmed Awad, Amjad Hawash
Reversible Logic Synthesis Using Binary Decision Diagrams With Exploiting Efficient Reordering Operators. IEEE Access 8 (2020)
Ahmed Awad, Baker Abdalhaq, Amjad Hawash, Douglas Johnson
A Comparative Analysis of Binary Decision Diagram Reordering Algorithms for Reversible Circuit Synthesis. SSCI (2018)
Ahmed Awad, Atsushi Takahashi, Satoshi Tanaka, Chikaaki Kodama
A Fast Process-Variation-Aware Mask Optimization Algorithm With a Novel Intensity Modeling. IEEE Trans. Very Large Scale Integr. Syst. 25 (3) (2017)
Ahmed Awad, Atsushi Takahashi, Satoshi Tanaka, Chikaaki Kodama
Intensity Difference Map (IDM) Accuracy Analysis for OPC Efficiency Verification and Further Enhancement. IPSJ Trans. Syst. LSI Des. Methodol. 10 (2017)
Ahmed Awad, Atsushi Takahashi, Chikaaki Kodama
A Fast Mask Manufacturability and Process Variation Aware OPC Algorithm with Exploiting a Novel Intensity Estimation Model. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (12) (2016)
Ahmed Awad, Atsushi Takahashi, Chikaaki Kodama
A fast manufacturability aware Optical Proximity Correction (OPC) algorithm with adaptive wafer image estimation. DATE (2016)
Ahmed Awad, Atsushi Takahashi, Satoshi Tanaka, Chikaaki Kodama
A fast process variation and pattern fidelity aware mask optimization algorithm. ICCAD (2014)