SCANNING ELECTRON MICROSCOPE
Experts
- Sergej Fatikow
- Torsten Sievers
- Sounkalo Dembélé
- Nadine Piat
- Toshio Fukuda
- Hitoshi Muguruma
- Luca Schenato
- Takafumi Taniguchi
- Shun'ichiro Ohmi
- Zhan Yang
- Hiroyuki Uchiyama
- Naresh Marturi
- Srikanth Venkataraman
- Lixin Dong
- Antonio-Daniele Capobianco
- P. T. Lai
- Jacques Blum
- Marco Comini
- Sajid Gul Khawaja
- Kok-Swee Sim
- Tomoyuki Kuroki
- Norah Saleh Alghamdi
- Yuji Iwahori
- João Dallyson Sousa de Almeida
- Jean-Pierre Boeuf
- Petra Perner
- Yong Zhang
- Grzegorz Fabianski
- Kenji Funahashi
- Chaochen Gu
- Naoya Murata
- Arslan Shaukat
- Yiming Pi
- Geraldo Braz Junior
- Xinping Guan
- Brahim Tamadazte
- Hao Cheng
- Hina Raja
- J. P. Xu
Venues
- Sensors
- Comput. Phys. Commun.
- CoRR
- Symmetry
- Microelectron. Reliab.
- J. Comput. Phys.
- IEICE Trans. Electron.
- IAS
- IEEE Access
- ICRA
- NEMS
- IROS
- Entropy
- IEEE Trans. Consumer Electron.
- IEICE Electron. Express
- SIAM J. Math. Anal.
- Comput. Biol. Medicine
- VTS
- Displays
- Appl. Math. Lett.
- IEEE Trans. Instrum. Meas.
- MHS
- Appl. Math. Comput.
- ITC
- IBM J. Res. Dev.
- Wirel. Commun. Mob. Comput.
- MeMeA
- BIODEVICES
- VISION
- Ann. UMCS Informatica
- IEEE Trans. Biomed. Eng.
- Proc. IEEE
- ICICDT
- J. Nonlinear Sci.
- IEEE Trans. Ind. Electron.
- Appl. Artif. Intell.
- J. Sci. Comput.
- BHI
- CASE
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