VTS

Publications

2024

Yingyi Luo, Talha M. Khan, Emadeldeen Hamdan, Xin Zhu, Hongyi Pan, Didem Ozevin, A. Enis Çetin
AlN Sputtering Parameter Estimation Using A Multichannel Parallel DCT Neural Network. VTS (2024)
Irith Pomeranz
Test Compaction Using (k, 1)-Cycle Tests. VTS (2024)
Juan-David Guerrero-Balaguera, Josie E. Rodriguez Condia, Marco Levorato, Matteo Sonza Reorda
Evaluating the Reliability of Supervised Compression for Split Computing. VTS (2024)
Shao-Chun Hung, Partho Bhoumik, Krishnendu Chakrabarty
Testing and Fault Diagnosis for Multi-level Resistive Random-Access Memory in Monolithic 3D Integration. VTS (2024)
Mingyuan Xiang, Xuhan Xie, Pedro Savarese, Xin Yuan, Michael Maire, Yanjing Li
Drop-Connect as a Fault-Tolerance Approach for RRAM-based Deep Neural Network Accelerators. VTS (2024)
Tommaso Baldi, Javier Campos, Benjamin Hawks, Jennifer Ngadiuba, Nhan Tran, Daniel Diaz, Javier M. Duarte, Ryan Kastner, Andres Meza, Melissa Quinnan, Olivia Weng, Caleb Geniesse, Amir Gholami, Michael W. Mahoney, Vladimir Loncar, Philip C. Harris, Joshua Agar, Shuyu Qin
Reliable edge machine learning hardware for scientific applications. VTS (2024)
Emre Ulusoy, Bahadir Ozkan, Furkan Barin, Fatih Maden, Ercem Yesil, Dursun Baran, Adem Eren, Tufan Coskun Karalar, Ahmet Tekin, Ertan Zencir
High Precision Adaptive Calibration Feedback in RF Front-end for Digital Pre-distortion Application. VTS (2024)
Subashini Gopalsamy, Irith Pomeranz
A Storage Based LBIST Scheme for Logic Diagnosis. VTS (2024)
Sanjay Das, Shamik Kundu, Anand Menon, Yihui Ren, Shubha Kharel, Kanad Basu
Analyzing and Mitigating Circuit Aging Effects in Deep Learning Accelerators. VTS (2024)
Fei Su, Jyotika Athavale, Zohaib Khan, Marc Witteman
Innovation Practices Track: Advances on Silicon Lifecycle Reliability, Safety and Security. VTS (2024)
Abdullah Eroglu, M. N. Mahmoud
Artificial Intelligence Based High Power Calibration Method for RF Pulse Amplifiers. VTS (2024)
Ishaan Bassi, Sule Ozev
Calibration and Source Localization Using an Array of Resistive Metal Oxide Gas Sensors. VTS (2024)
Saeed Zeinolabedinzadeh
Millimeter-wave and THz Measurement Practices. VTS (2024)
Jaehyun Park, Alish Kanani, Lukas Pfromm, Harsh Sharma, Parth Solanki, Eric Tervo, Janardhan Rao Doppa, Partha Pratim Pande, Ümit Y. Ogras
Thermal Modeling and Management Challenges in Heterogenous Integration: 2.5D Chiplet Platforms and Beyond. VTS (2024)
Ralf E.-H. Yee, Nicholas Y.-J. Su, Lowry P.-T. Wang, Charles H.-P. Wen, Herming Chiueh
Temperature-Insensitive Soft-Error-Tolerant Flip-Flop Design For Automotive Electronics. VTS (2024)
42nd IEEE VLSI Test Symposium, VTS 2024, Tempe, AZ, USA, April 22-24, 2024 VTS (2024)
Apurva Jain, Thomas Broadfoot, Carl Sechen, Yiorgos Makris
Testing a Transistor-Level Programmable Fabric: Challenges and Solutions. VTS (2024)
Yiqiang Zhao, Gonsen Qu, Qizhi Zhang, Yao Li, Zhengyang Li, Jiaji He
Static Gate-Level Information Flow for Hardware Information Security with Bounded Model Checking. VTS (2024)
Mingye Li, Yunkun Lin, Sandeep Gupta
Built in self test (BIST) for RSFQ circuits. VTS (2024)
Haruo Kobayashi, Naoki Tsukahara, Keno Sato, Takashi Oshima
Innovative Practices Session at VLSI Test Symposium 2024: Analog Testing Technologies for Digital Exploding Society. VTS (2024)
Gulroz Singh, Ankit Hegde, Vaibhav Kumar
Unified Functional Safety Framework for advance multi-domain SoCs combining ISO 26262 & IEC61508. VTS (2024)
Vahid Rezazadehshabilouyoliya, Muhammed Mustafa Kizmaz, Ahmet Tekin
Power-up Self Auto Calibration of High Speed SAR Converter in a 22nm FD-SOI CMOS Process. VTS (2024)
Carl S. Moore
Innovative Practices Track: Session 7 Yield Optimization, Reducing Costs, and Improving Quality. VTS (2024)
Ferhat Can Ataman, Mohammed Aladsani, Y. B. Chethan Kumar, Georgios C. Trichopoulos, Sule Ozev
Multi-Parameter Optimization of mm-Wave Antenna Layout Using Hybrid Modeling and Incremental Model Learning. VTS (2024)
Suhas Krishna Kashyap, Chinmaye Raghavendra, Suriyaprakash Natarajan, Sule Ozev
Structural Built In Self Test of Analog Circuits using ON/OFF Keying and Delay Monitors. VTS (2024)
Robert Limas Sierra, Juan-David Guerrero-Balaguera, Francesco Pessia, Josie E. Rodriguez Condia, Matteo Sonza Reorda
Analyzing the Impact of Scheduling Policies on the Reliability of GPUs Running CNN Operations. VTS (2024)
Sumukh Prashant Bhanushali, Tushar Gupta, Debnath Maiti, Arindam Sanyal
Machine Learning Based Static and Dynamic Error Calibration in Data Converters. VTS (2024)
Stephen Traynor, Saidapet Ramesh, Maryfe Hernandez, Lawrence Herr, Scott Chen
Customizing ATPG User-Defined Stresses and Tests To Target Cell-Neighborhood-Bridging Defects. VTS (2024)
Chandarasekaran Ramamurthy, Harrish Anbazhagan, B. Rajeswara
Test Methods for TID Effects on Capacitors. VTS (2024)
Xunyu Li, Weiquan Hao, Zijin Pan, Yunru Miao, Zijian Yue, Albert Z. Wang
Practical Considerations on ESD Testing. VTS (2024)
Sina Bakhtavari Mamaghani, Jongsin Yun, Martin Keim, Mehdi B. Tahoori
Multi-Level Reference for Test Coverage Enhancement of Resistive-Based NVM. VTS (2024)
Mahta Mayahinia, Haneen G. Hezayyin, Mehdi B. Tahoori
Reliability analysis and mitigation for analog computation-in-memory: from technology to application. VTS (2024)
Mohamed Mejri, Chandramouli N. Amarnath, Abhijit Chatterjee
Error Resilient Hyperdimensional Computing Using Hypervector Encoding and Cross-Clustering. VTS (2024)
Arani Sinha, Stefano Di Carlo
Innovative Practices Track: Session 4 AI Applications in Test. VTS (2024)
Duane Brown, Ira Leventhal, Sri Ganta, Keith Schaub
Innovative Practices Track: Session 6 - Using AI to Address the Silicon Growth Curve. VTS (2024)
Abhishek Mishra, Mohammad Ershad Shaik, Anush Lingamoorthy, Suman Kumar, Anup Das, Nagarajan Kandasamy, Nur A. Touba
WaferCap: Open Classification of Wafer Map Patterns using Deep Capsule Network. VTS (2024)
Stephen Sunter, Vladimir Zivkovic, Bartlomiej Praselski
A Method for Simulating Mixed-Signal ATE Tests. VTS (2024)
Vidya A. Chhabria, Wenjing Jiang, Andrew B. Kahng, Rongjian Liang, Haoxing Ren, Sachin S. Sapatnekar, Bing-Yue Wu
OpenROAD and CircuitOps: Infrastructure for ML EDA Research and Education. VTS (2024)
D. Wilson, Nad E. Gilbert, Matt Spear, J. Short, Christopher H. Bennett, William Wahby, J. Kim, Robin Jacobs-Gedrim, Tianyao Patrick Xiao, S. Agarwal, Matthew J. Marinella
A Discovery Platform to Characterize Emerging Nonvolatile Memories for Computing. VTS (2024)
Rahul Kande, Vasudev Gohil, Matthew DeLorenzo, Chen Chen, Jeyavijayan Rajendran
LLMs for Hardware Security: Boon or Bane? VTS (2024)
Mohammad Hasan Ahmadilivani, Alberto Bosio, Bastien Deveautour, Fernando Fernandes dos Santos, Juan-David Guerrero-Balaguera, Maksim Jenihhin, Angeliki Kritikakou, Robert Limas Sierra, Salvatore Pappalardo, Jaan Raik, Josie E. Rodriguez Condia, Matteo Sonza Reorda, Mahdi Taheri, Marcello Traiola
Special Session: Reliability Assessment Recipes for DNN Accelerators. VTS (2024)
Gaines Odom, Zakia Tamanna Tisha, Ujjwal Guin
A Novel Self-referencing Approach Using Memory Power-up States for Detecting COTS SRAMs. VTS (2024)
Erik Jan Marinissen, Vineet Pancholi, Po-Yao Chuang, Martin Keim
IEEE Std P3405: New Standard-under-Development for Chiplet Interconnect Test and Repair. VTS (2024)
Kai Su, Mark Giraud, Anne Borcherding, Jonas Krautter, Philipp Nenninger, Mehdi Baradaran Tahoori
Fuzz Wars: The Voltage Awakens - Voltage-Guided Blackbox Fuzzing on FPGAs. VTS (2024)
Nourhan Elhamawy, Jens Anders, Ilia Polian, Matthias Sauer
Scenario-based Test Content Optimization: Scan Test vs. System-Level Test. VTS (2024)
Ian Hill, Mateo Rendón, André Ivanov
Enhanced Wear-Out Sensor Design in a 12nm Process for Separable Stress Regime Monitoring. VTS (2024)
Valentin Gherman, Cyrille Laffond
Sequential Decoders for Binary Linear Block ECCs. VTS (2024)
Arani Sinha
Innovative Practices Track: Session 3 Test and Functional Safety Standards. VTS (2024)
Soyed Tuhin Ahmed, Surendra Hemaram, Mehdi B. Tahoori
NN-ECC: Embedding Error Correction Codes in Neural Network Weight Memories using Multi-task Learning. VTS (2024)
Raphael Robertazzi, David J. Frank, Kevin Tien, John Timmerwilke, Peilin Song, Daniel J. Friedman
Characterization of 14nm CMOS Technology At Cryogenic Temperatures Using Dense Addressable Arrays. VTS (2024)