PAN TILT ZOOM
Experts
- Gérard G. Medioni
- Srikanth Saripalli
- Yi Yao
- Mongi A. Abidi
- Marc Pollefeys
- Wilfried Philips
- Besma R. Abidi
- Yinghao Cai
- Alberto Del Bimbo
- Giuseppe Lisanti
- Federico Pernici
- Subodh Mishra
- Guillaume-Alexandre Bilodeau
- Zhigang Zhu
- Gaurav Pandey
- Claudio Piciarelli
- Jean-Marc Lavest
- Jonathan Kelly
- Rong Xiong
- Jianhui Chen
- Yue Wang
- Hanqi Zhuang
- Sudipta N. Sinha
- Iacopo Masi
- James J. Little
- Quoc Cuong Pham
- Christian Micheloni
- Gian Luca Foresti
- Mohan S. Kankanhalli
- Imran N. Junejo
- Xiang Chen
- Shichun Guo
- Hong-Yuan Mark Liao
- Junzhi Guan
- Jaihie Kim
- Hassan Foroosh
- Christophe Tilmant
- Yael Moses
- Romaric Audigier
Venues
- CoRR
- ICDSC
- ICRA
- Sensors
- IROS
- AVSS
- CVPR
- IEEE Trans. Instrum. Meas.
- ICIP
- Mach. Vis. Appl.
- ICPR
- ITSC
- ROBIO
- Comput. Vis. Image Underst.
- Remote. Sens.
- WACV
- IEEE Access
- CVPR Workshops
- ACC
- J. Electronic Imaging
- IQSP
- VSSN@MM
- IEEE Robotics Autom. Lett.
- ICME
- ICPR (1)
- IEEE Trans. Pattern Anal. Mach. Intell.
- IGARSS
- ICVGIP
- IET Comput. Vis.
- IEEE Trans. Robotics
- IEEE Trans. Circuits Syst. Video Technol.
- CAIP
- Image Vis. Comput.
- ICCP
- EUSIPCO
- INFOCOM
- Multim. Tools Appl.
- ICMLC
- MVA
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