MODEL BASED DIAGNOSIS
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Ratnesh Kumar
- Shigemasa Takai
- Franz Wotawa
- Feng Lin
- Stéphane Lafortune
- Christoforos N. Hadjicostis
- Walter Murray Wonham
- Rui Abreu
- Kai Cai
- Matteo Sonza Reorda
- Wu-Tung Cheng
- Shaolong Shu
- Alessandro Giua
- Toshimitsu Ushio
- Carla Seatzu
- Sun-Yuan Hsieh
- Renyuan Zhang
- Zhiwu Li
- Raimund Ubar
- Karen Rudie
- Xiang Yin
- Krishnendu Chakrabarty
- Gerhard Friedrich
- Fabrizio Lombardi
- Daowen Qiu
- Patrick Rodler
- Srikanth Venkataraman
- Jan Komenda
- Rolf Drechsler
- Jaan Raik
- Arjan J. C. van Gemund
- Gregory M. Provan
- Yu Huang
- Masahiro Fujita
- Sreejit Chakravarty
- Pietro Torasso
- Vishwani D. Agrawal
Venues
- CoRR
- ITC
- IEEE Trans. Autom. Control.
- CDC
- IEEE Access
- Autom.
- ACC
- IEEE Trans. Computers
- Sensors
- VTS
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- Discret. Event Dyn. Syst.
- Expert Syst. Appl.
- SMC
- IEEE Trans. Ind. Electron.
- AAAI
- DATE
- IJCAI
- IEEE Trans. Instrum. Meas.
- J. Electron. Test.
- DAC
- ECAI
- VLSI Design
- Inf. Sci.
- Asian Test Symposium
- ECC
- AMIA
- IEEE Trans. Very Large Scale Integr. Syst.
- ICCAD
- IEEE Trans Autom. Sci. Eng.
- DFT
- Comput. Biol. Medicine
- IEA/AIE
- WODES
- Artif. Intell. Medicine
- ETS
- ISCAS
- EMBC
- Theor. Comput. Sci.
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