ETS

Publications

2024

Sandeep Kumar Goel, Ankita Patidar, Frank Lee
Scan Design Using Unsupervised Machine Learning to Reduce Functional Timing and Area Impact. ETS (2024)
Aniruddha Datta, Bhanu Vikas Yaganti, Andrew Dove, Arik Peltz, Krishnendu Chakrabarty
Test-Fleet Optimization Using Machine Learning. ETS (2024)
Rama Govindaraju
Silent Data Corruption Errors in VLSI Circuits: Implications, Challenges, and Opportunities. ETS (2024)
Dennis Gnad, Martin Gotthard, Jonas Krautter, Angeliki Kritikakou, Vincent Meyers, Paolo Rech, Josie E. Rodriguez Condia, Annachiara Ruospo, Ernesto Sánchez, Fernando Fernandes dos Santos, Olivier Sentieys, Mehdi B. Tahoori, Russell Tessier, Marcello Traiola
Reliability and Security of AI Hardware. ETS (2024)
Tolga Aksoy, Nikhil Sagar Modala, Lakshmanan Balasubramanian, Rubin A. Parekhji, Sule Ozev
Hierarchical Fault Simulation for Mixed-Signal Circuits Using Template Based Fault Response Modeling. ETS (2024)
Denis Schwachhofer, Peter Domanski, Steffen Becker, Stefan Wagner, Matthias Sauer, Dirk Pflüger, Ilia Polian
Training Large Language Models for System-Level Test Program Generation Targeting Non-functional Properties. ETS (2024)
Erik Jan Marinissen, Adrian Evans, Po-Yao Chuang, Martin Keim, Anshuman Chandra
New Standard-under-Development for Chiplet Interconnect Test and Repair: IEEE Std P3405. ETS (2024)
Jayeeta Chaudhuri, Krishnendu Chakrabarty
Detection of Stealthy Bitstreams in Cloud FPGAs using Graph Convolutional Networks. ETS (2024)
Seyedeh Maryam Ghasemi, Jonas Krautter, Tara Gheshlaghi, Sergej Meschkov, Dennis R. E. Gnad, Mehdi B. Tahoori
Degradation Monitoring Through Software-controlled On-chip Sensors for RISC-V. ETS (2024)
Xin-Ping Chen, Hsu-Yu Huang, Chu-Yun Hsiao, Jennifer Shueh-Inn Hu, James Chien-Mo Li
Test Compression for Neuromorphic Chips. ETS (2024)
Marcello Traiola, Salvatore Pappalardo, Ali Piri, Annachiara Ruospo, Bastien Deveautour, Ernesto Sánchez, Alberto Bosio, Sepide Saeedi, Alessio Carpegna, Anil Bayram Gogebakan, Enrico Magliano, Alessandro Savino
Approximate Fault-Tolerant Neural Network Systems. ETS (2024)
Michele Portolan, Martin Keim, J. F. Coté, Hans-Martin Von Staud
What Would Interactive Testing With 1687 Look Like? ETS (2024)
Luc Romain, Paul-Patrick Nordmann, Benoit Nadeau-Dostie, Lori Schramm, Martin Keim
Combining Built-In Redundancy Analysis with ECC for Memory Testing. ETS (2024)
Luca Parrini, Taha Soliman, Benjamin Hettwer, Jan Micha Borrmann, Simranjeet Singh, Ankit Bende, Vikas Rana, Farhad Merchant, Norbert Wehn
Error Detection and Correction Codes for Safe In-Memory Computations. ETS (2024)
Sicong Yuan, Mohammad Amin Yaldagard, Hanzhi Xun, Moritz Fieback, Erik Jan Marinissen, Woojin Kim, Siddharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui
Design-for-Test for Intermittent Faults in STT-MRAMs. ETS (2024)
Priyanjana Pal, Florentia Afentaki, Haibin Zhao, Gurol Saglam, Michael Hefenbrock, Georgios Zervakis, Michael Beigl, Mehdi B. Tahoori
Fault Sensitivity Analysis of Printed Bespoke Multilayer Perceptron Classifiers. ETS (2024)
Riccardo Cantoro, Michelangelo Grosso, Iacopo Guglielminetti, Reza Khoshzaban, Matteo Sonza Reorda
Assessing the Effectiveness of Software-Based Self-Test Programs for Static Cell-Aware Test. ETS (2024)
Mohamed Nadeem, Chandan Kumar Jha, Rolf Drechsler
Polynomial Formal Verification of Approximate Adders with Constant Cutwidth. ETS (2024)
Yong Liu, Yuejun Liu, Yongbin Zhou, Yiwen Gao, Zehua Qiao, Huaxin Wang
A Novel Power Analysis Attack against CRYSTALS-Dilithium Implementation. ETS (2024)
Dimitris Gizopoulos, George Papadimitriou, Odysseas Chatzopoulos, Nikos Karystinos, Harish Dattatraya Dixit, Sriram Sankar
Silent Data Corruptions in Computing Systems: Early Predictions and Large-Scale Measurements. ETS (2024)
Han Yan, Shuai Chen, Junying Huang, Jing Ye, Huawei Li, Xiaowei Li
A Fully Pipelined High-Performance Elliptic Curve Cryptography Processor for NIST P-256. ETS (2024)
Josie E. Rodriguez Condia, Juan-David Guerrero-Balaguera, Robert Limas Sierra, Matteo Sonza Reorda
Analyzing the Structural and Operational Impact of Faults in Floating-Point and Posit Arithmetic Cores for CNN Operations. ETS (2024)
Nassim Riadi, Florent Bruguier, Pascal Benoit, Sophie Dupuis, Marie-Lise Flottes
Power Analysis Attack Against post-SAT Logic Locking schemes. ETS (2024)
Fouwad Jamil Mir, Abdullah Aljuffri, Said Hamdioui, Mottaqiallah Taouil
Extracting Weights of CIM-Based Neural Networks Through Power Analysis of Adder-Trees. ETS (2024)
Heguo Yin, Peter Poechmueller
Semiconductor Application Fail Root Causes And Secure Test Remedy. ETS (2024)
Moritz Fieback, Letícia Maria Veiras Bolzani Poehls
Lifecycle Management of Emerging Memories. ETS (2024)
Pushpak Raj Gautam, Alex Orailoglu
Transcoders: A Better Alternative To Denoising Autoencoders. ETS (2024)
David C. Keezer, Dany Minier, Hongjie Li
Characterization of Ultra-low Random Jitter Reduction Methods up to 36 GHz. ETS (2024)
Alessandro Veronesi, Alessandro Nazzari, Dario Passarello, Milos Krstic, Michele Favalli, Luca Cassano, Antonio Miele, Davide Bertozzi, Cristiana Bolchini
Cross-Layer Reliability Analysis of NVDLA Accelerators: Exploring the Configuration Space. ETS (2024)
Davide Turossi, Andrea Baschirotto
A SystemC-AMS Development Framework for High Power IC Test-Hardware. ETS (2024)
IEEE European Test Symposium, ETS 2024, The Hague, Netherlands, May 20-24, 2024 ETS (2024)
Troya Çagil Köylü, Cornelis Christiaan Berg, Praveen Kumar Vadnala
CGAN-based Automated Fault Injection. ETS (2024)
Hanieh Jafarzadeh, Florian Klemme, Hussam Amrouch, Sybille Hellebrand, Hans-Joachim Wunderlich
Time and Space Optimized Storage-based BIST under Multiple Voltages and Variations. ETS (2024)
Anurup Saha, Kwondo Ma, Chandramouli N. Amarnath, Abhijit Chatterjee
Post-Manufacture Criticality-Aware Gain Tuning of Timing Encoded Spiking Neural Networks for Yield Recovery. ETS (2024)
Vladimir A. Zivkovic, Inga Abel, Anthony Candage
A Concept of Provably Detected Defects for Analog Defect Simulation Campaign Improvement. ETS (2024)
Suhasini Komarraju, Mohamed Mejri, Akhil Tammana, Gowsika Dharmaraj, Chandramouli N. Amarnath, Abhijit Chatterjee
AMS Test Stimulus Generation and Response Analysis Using Hyperdimensional Clustering: Minimizing Misclassification Rate. ETS (2024)
Denis Schwachhofer, Francesco Angione, Steffen Becker, Stefan Wagner, Matthias Sauer, Paolo Bernardi, Ilia Polian
Optimizing System-Level Test Program Generation via Genetic Programming. ETS (2024)
Cheng-Wen Wu, Shi-Yu Huang
Keynote 2 - Sustainability and the Outlook of Semiconductor Industry. ETS (2024)
Chris Nigh, Ruben Purdy, Wei Li, Subhasish Mitra, R. D. Shawn Blanton
Faulty Function Extraction for Defective Circuits. ETS (2024)
Ric Dokken
Hardware-Independent ATE Software for SLT. ETS (2024)
Juergen Alt
It is All About Trust: The Road to Autonomous Driving Will Connect Test, Reliability and Safety. ETS (2024)
Jongsin Yun, Sina Bakhtavari Mamaghani, Mehdi B. Tahoori, Christopher Münch, Martin Keim
MBIST-based weak bit screening method for embedded MRAM. ETS (2024)
Damiano Zuccalà, Jean-Marc Daveau, Philippe Roche, Katell Morin-Allory
Formal Resilience Metric Characterization in Complex Digital Systems. ETS (2024)
Christoph Hazott, Daniel Große
Relation Coverage: A New Paradigm for Hardware/Software Testing. ETS (2024)
Hanzhi Xun, Moritz Fieback, Mohammad Amin Yaldagard, Sicong Yuan, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui
Online Detection of Unique Faults in RRAMs. ETS (2024)
Tsung-Hsuan Wang, Po-Yao Chuang, Francesco Lorenzelli, Erik Jan Marinissen
Test and Repair Improvements for UCIe. ETS (2024)
Aghiles Douadi, Elena Ioana Vatajelu, Paolo Maistri, David Hély, Vincent Beroulle, Giorgio Di Natale
Modeling Thermal Effects For Biasing PUFs. ETS (2024)
Shlomo Engelberg, Osnat Keren
Hardening Bus-Encoders with Power-Aware Single Error Correcting Codes. ETS (2024)
Yu-Guang Chen, Hsiu-Yi Yang, Ing-Chao Lin
GNN-Based INC and IVC Co-Optimization for Aging Mitigation. ETS (2024)
Soyed Tuhin Ahmed, Kamal Danouchi, Michael Hefenbrock, Guillaume Prenat, Lorena Anghel, Mehdi B. Tahoori
Testing Spintronics Implemented Monte Carlo Dropout-Based Bayesian Neural Networks. ETS (2024)