MBIST-based weak bit screening method for embedded MRAM.
Jongsin YunSina Bakhtavari MamaghaniMehdi B. TahooriChristopher MünchMartin KeimPublished in: ETS (2024)
Keyphrases
- high precision
- high accuracy
- experimental evaluation
- detection method
- cost function
- prior knowledge
- significant improvement
- dynamic programming
- similarity measure
- preprocessing
- mutual information
- support vector machine svm
- detection algorithm
- computational complexity
- support vector
- k means
- pairwise
- computational cost
- theoretical analysis
- synthetic data