Asian Test Symposium

Publications

2013

Da Cheng, Hsunwei Hsiung, Bin Liu, Jianing Chen, Jia Zeng, Ramesh Govindan, Sandeep K. Gupta
A New March Test for Process-Variation Induced Delay Faults in SRAMs. Asian Test Symposium (2013)
Hsun-Cheng Lee, Jacob A. Abraham
Digital Calibration for 8-Bit Delay Line ADC Using Harmonic Distortion Correction. Asian Test Symposium (2013)
Guoliang Li, Jun Qian, Yuan Zuo, Rui Li, Qinfu Yang
Scan Test Data Volume Reduction for SoC Designs in EDT Environment. Asian Test Symposium (2013)
Long-Yi Lin, Hao-Chiao Hong
Design of a Fault-Injectable Fleischer-Laker Switched-Capacitor Biquad for Verifying the Static Linear Behavior Fault Model. Asian Test Symposium (2013)
Yanhong Zhou, Tiancheng Wang, Tao Lv, Huawei Li, Xiaowei Li
Path Constraint Solving Based Test Generation for Hard-to-Reach States. Asian Test Symposium (2013)
Sen-Wen Hsiao, Xian Wang, Abhijit Chatterjee
Analog Sensor Based Testing of Phase-Locked Loop Dynamic Performance Parameters. Asian Test Symposium (2013)
Chih-Sheng Hou, Jin-Fu Li
Testing Disturbance Faults in Various NAND Flash Memories. Asian Test Symposium (2013)
Ran Wang, Krishnendu Chakrabarty, Bill Eklow
Post-bond Testing of the Silicon Interposer and Micro-bumps in 2.5D ICs. Asian Test Symposium (2013)
Suvadeep Banerjee, Hyun Woo Choi, David C. Keezer, Abhijit Chatterjee
Enhanced Resolution Time-Domain Reflectometry for High Speed Channels: Characterizing Spatial Discontinuities with Non-ideal Stimulus. Asian Test Symposium (2013)
Masaki Hashizume, Tomoaki Konishi, Hiroyuki Yotsuyanagi, Shyue-Kung Lu
Testable Design for Electrical Testing of Open Defects at Interconnects in 3D ICs. Asian Test Symposium (2013)
Arpita Dutta, Subhadip Kundu, Santanu Chattopadhyay
Thermal Aware Don't Care Filling to Reduce Peak Temperature and Thermal Variance during Testing. Asian Test Symposium (2013)
Kentaroh Katoh, Yuta Doi, Satoshi Ito, Haruo Kobayashi, Ensi Li, Nobukazu Takai
An Analysis of Stochastic Self-Calibration of TDC Using Two Ring Oscillators. Asian Test Symposium (2013)
Kun-Han Tsai, Xijiang Lin
Multicycle-aware At-speed Test Methodology. Asian Test Symposium (2013)
Yasuo Sato, Seiji Kajihara
A Stochastic Model for NBTI-Induced LSI Degradation in Field. Asian Test Symposium (2013)
Hsunwei Hsiung, Da Cheng, Bin Liu, Ramesh Govindan, Sandeep K. Gupta
Interplay of Failure Rate, Performance, and Test Cost in TCAM under Process Variations. Asian Test Symposium (2013)
Bing-Yang Lin, Mincent Lee, Cheng-Wen Wu
Exploration Methodology for 3D Memory Redundancy Architectures under Redundancy Constraints. Asian Test Symposium (2013)
Dong Xiang
A Cost-Effective Scheme for Network-on-Chip Router and Interconnect Testing. Asian Test Symposium (2013)
Dominik Erb, Michael A. Kochte, Matthias Sauer, Hans-Joachim Wunderlich, Bernd Becker
Accurate Multi-cycle ATPG in Presence of X-Values. Asian Test Symposium (2013)
Wooheon Kang, Changwook Lee, Keewon Cho, Sungho Kang
A Die Selection and Matching Method with Two Stages for Yield Enhancement of 3-D Memories. Asian Test Symposium (2013)
Bing-Chuan Bai, Chun-Lung Hsu, Ming-Hsueh Wu, Chen-An Chen, Yee-Wen Chen, Kun-Lun Luo, Liang-Chia Cheng, James Chien-Mo Li
Back-End-of-Line Defect Analysis for Rnv8T Nonvolatile SRAM. Asian Test Symposium (2013)
Peter Sarson, Gregor Schatzberger, Robert Seitz
Automotive EEPROM Qualification and Cost Optimization. Asian Test Symposium (2013)
Xian Wang, Blanchard Kenfack, Estella Silva, Abhijit Chatterjee
Built-In Test of Switched-Mode Power Converters: Avoiding DUT Damage Using Alternative Safe Measurements. Asian Test Symposium (2013)
22nd Asian Test Symposium, ATS 2013, Yilan County, Taiwan, November 18-21, 2013 Asian Test Symposium (2013)
Jose Moreira, Bernhard Roth, Hubert Werkmann, Lars Klapproth, Michael Howieson, Mark Broman, Wend Ouedraogo, Mitchell Lin
An Active Test Fixture Approach for 40 Gbps and Above At-Speed Testing Using a Standard ATE System. Asian Test Symposium (2013)
Koji Yamazaki, Toshiyuki Tsutsumi, Hiroshi Takahashi, Yoshinobu Higami, Hironobu Yotsuyanagi, Masaki Hashizume, Kewal K. Saluja
Diagnosing Resistive Open Faults Using Small Delay Fault Simulation. Asian Test Symposium (2013)
Rafal Baranowski, Michael A. Kochte, Hans-Joachim Wunderlich
Securing Access to Reconfigurable Scan Networks. Asian Test Symposium (2013)
Fang Bao, Mohammad Tehranipoor, Harry Chen
Worst-Case Critical-Path Delay Analysis Considering Power-Supply Noise. Asian Test Symposium (2013)
Yingchieh Ho, Katherine Shu-Min Li, Sying-Jyan Wang
Leakage Monitoring Technique in Near-Threshold Systems with a Time-Based Bootstrapped Ring Oscillator. Asian Test Symposium (2013)
Tong-Yu Hsieh, Yi-Han Peng, Chia-Chi Ku
An Efficient Test Methodology for Image Processing Applications Based on Error-Tolerance. Asian Test Symposium (2013)
Masafumi Nikaido, Yukihisa Funatsu, Tetsuya Seiyama, Junpei Nonaka, Kazuki Shigeta
Failure Localization of Logic Circuits Using Voltage Contrast Considering State of Transistors. Asian Test Symposium (2013)
Kohei Miyase, Matthias Sauer, Bernd Becker, Xiaoqing Wen, Seiji Kajihara
Search Space Reduction for Low-Power Test Generation. Asian Test Symposium (2013)
Wei-Cheng Lien, Kuen-Jong Lee, Tong-Yu Hsieh, Krishnendu Chakrabarty
A New LFSR Reseeding Scheme via Internal Response Feedback. Asian Test Symposium (2013)
Stephan Eggersglüß
Peak Capture Power Reduction for Compact Test Sets Using Opt-Justification-Fill. Asian Test Symposium (2013)
Yuki Fukazawa, Tsuyoshi Iwagaki, Hideyuki Ichihara, Tomoo Inoue
A Transient Fault Tolerant Test Pattern Generator for On-line Built-in Self-Test. Asian Test Symposium (2013)
Amit Kumar, Janusz Rajski, Sudhakar M. Reddy, Thomas Rinderknecht
On the Generation of Compact Deterministic Test Sets for BIST Ready Designs. Asian Test Symposium (2013)
Chi-Jih Shih, Shih-An Hsieh, Yi-Chang Lu, James Chien-Mo Li, Tzong-Lin Wu, Krishnendu Chakrabarty
Test Generation of Path Delay Faults Induced by Defects in Power TSV. Asian Test Symposium (2013)
Spencer K. Millican, Kewal K. Saluja
Formulating Optimal Test Scheduling Problem with Dynamic Voltage and Frequency Scaling. Asian Test Symposium (2013)
Elena I. Vatajelu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
Adaptive Source Bias for Improved Resistive-Open Defect Coverage during SRAM Testing. Asian Test Symposium (2013)
Chin Hai Ang
Single Test Clock with Programmable Clock Enable Constraints for Multi-clock Domain SoC ATPG Testing. Asian Test Symposium (2013)
Chi-Chun Yang, Che-Wei Chou, Jin-Fu Li
A TSV Repair Scheme Using Enhanced Test Access Architecture for 3-D ICs. Asian Test Symposium (2013)
Li-Ren Huang, Shi-Yu Huang, Kun-Han Tsai, Wu-Tung Cheng, Stephen K. Sunter
Mid-bond Interposer Wire Test. Asian Test Symposium (2013)
Kelson Gent, Michael S. Hsiao
Functional Test Generation at the RTL Using Swarm Intelligence and Bounded Model Checking. Asian Test Symposium (2013)
Jie Jiang, Marina Aparicio, Mariane Comte, Florence Azaïs, Michel Renovell, Ilia Polian
MIRID: Mixed-Mode IR-Drop Induced Delay Simulator. Asian Test Symposium (2013)
Shuo-You Hsu, Chih-Hsiang Hsu, Ting-Shuo Hsu, Jing-Jia Liou
A Region-Based Framework for Design Feature Identification of Systematic Process Variations. Asian Test Symposium (2013)
Chao Han, Adit D. Singh
Hazard Initialized LOC Tests for TDF Undetectable CMOS Open Defects. Asian Test Symposium (2013)
Koay Soon Chan, Nuzrul Fahmi Nordin, Kim Chon Chan, Terk Zyou Lok, Chee Wai Yong
Multi-histogram ADC BIST System for ADC Linearity Testing. Asian Test Symposium (2013)
Akihiro Tomita, Xiaoqing Wen, Yasuo Sato, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor, Laung-Terng Wang
On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST. Asian Test Symposium (2013)
Paolo Bernardi, Lyl M. Ciganda, Matteo Sonza Reorda, Said Hamdioui
An Efficient Method for the Test of Embedded Memory Cores during the Operational Phase. Asian Test Symposium (2013)
Ru Yi, Minghui Wu, Koji Asami, Haruo Kobayashi, Ramin Khatami, Atsuhiro Katayama, Isao Shimizu, Kentaroh Katoh
Digital Compensation for Timing Mismatches in Interleaved ADCs. Asian Test Symposium (2013)
Fangming Ye, Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu
Handling Missing Syndromes in Board-Level Functional-Fault Diagnosis. Asian Test Symposium (2013)