FEATURE TRACKING
Experts
- Stefano Soatto
- Marc Pollefeys
- Luc Van Gool
- Davide Scaramuzza
- Claude Jauffret
- Daniel Cremers
- Guillermo Gallego
- K. Madhava Krishna
- Michael J. Black
- Shuhan Shen
- Yiannis Aloimonos
- Takeo Kanade
- Alessio Del Bue
- Denis Pillon
- John Oliensis
- Tomás Pajdla
- J. M. M. Montiel
- Hainan Cui
- Richard Szeliski
- Andrew J. Davison
- Q. M. Jonathan Wu
- Shuaicheng Liu
- Cornelia Fermüller
- Didier Stricker
- Dmitry B. Goldgof
- Chandra Kambhamettu
- Horst Bischof
- Yasuaki Ito
- Yoshiaki Shirai
- Hujun Bao
- John S. Zelek
- Yasuyuki Sugaya
- Jan-Michael Frahm
- Zhanyi Hu
- Patrick Bouthemy
- Long Quan
- David Suter
- Koji Nakano
- Masayuki Fujita
Venues
- CoRR
- CVPR
- ICRA
- Sensors
- ICCV
- IROS
- ICIP
- Remote. Sens.
- IEEE Trans. Pattern Anal. Mach. Intell.
- BMVC
- IEEE Access
- ICPR
- Int. J. Comput. Vis.
- ROBIO
- ICASSP
- Image Vis. Comput.
- ACC
- Comput. Vis. Image Underst.
- FUSION
- WACV
- EMBC
- IEEE Robotics Autom. Lett.
- IEEE Trans. Instrum. Meas.
- Pattern Recognit.
- CVPR Workshops
- IGARSS
- IEEE Trans. Image Process.
- Pattern Recognit. Lett.
- MVA
- IEEE Trans. Circuits Syst. Video Technol.
- 3DV
- CRV
- ICCV Workshops
- NeuroImage
- ECCV (2)
- SMC
- Mach. Vis. Appl.
- IEICE Trans. Inf. Syst.
- ECCV (1)
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