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Experts
- Stan Z. Li
- Rama Chellappa
- Daijin Kim
- Prashant G. Mehta
- Yoshitaka Shibata
- Wen Gao
- Maja Pantic
- Thomas S. Huang
- Zhen Lei
- Luc Van Gool
- Koji Hashimoto
- Bogdan Kwolek
- Vijayan K. Asari
- Qiang Ji
- Franck Davoine
- Vishal M. Patel
- Fadi Dornaika
- Josef Kittler
- Brian C. Lovell
- Henry Medeiros
- Xilin Chen
- Mohan M. Trivedi
- Kazuhiko Terashima
- Juan José Pantrigo
- Maurizio Omologo
- Norikazu Ikoma
- Antonio S. Montemayor
- Yosuke Sato
- Yaser Sheikh
- Thomas B. Moeslund
- Anil K. Jain
- Shiguang Shan
- Junjie Yan
- Shin'ichi Satoh
- Shaogang Gong
- Guangyou Xu
- Chen Change Loy
- Kazuhiro Otsuka
- Marco Matassoni
Venues
- CoRR
- ICIP
- ICASSP
- IROS
- ICRA
- Sensors
- FUSION
- FG
- ICPR
- CVPR
- IEEE Access
- CVPR Workshops
- Multim. Tools Appl.
- EUSIPCO
- Pattern Recognit.
- ICCV
- SMC
- Image Vis. Comput.
- BMVC
- Pattern Recognit. Lett.
- ICME
- WACV
- ROBIO
- Neurocomputing
- Comput. Vis. Image Underst.
- AVSS
- IEEE Trans. Pattern Anal. Mach. Intell.
- MVA
- ACC
- IEEE Trans. Image Process.
- ACM Multimedia
- NeuroImage
- ICIP (3)
- IEEE Trans. Instrum. Meas.
- CHI Extended Abstracts
- IEEE Signal Process. Lett.
- CRV
- ICCV Workshops
- ICB
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