DIAGNOSTIC TESTS
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Abhijit Chatterjee
- W. Kent Fuchs
- Srikanth Venkataraman
- Wu-Tung Cheng
- Matteo Sonza Reorda
- Hans-Joachim Wunderlich
- Cheng-Wen Wu
- Juan de Dios Luna del Castillo
- Alexander Felfernig
- José Antonio Roldán Nofuentes
- Arne Wahrburg
- Krishnendu Chakrabarty
- Elizabeth M. Rudnick
- Janak H. Patel
- Yu Huang
- Huaxing Tang
- Jürgen Adamy
- Kewal K. Saluja
- Christopher G. Chute
- Vishwani D. Agrawal
- Dominique Sauter
- Guoqian Jiang
- Yervant Zorian
- James Chien-Mo Li
- Janusz Rajski
- Frédéric Besson
- Charles E. Stroud
- Miron Abramovici
- Michael S. Hsiao
- Alejandro Cook
- Yoshinobu Higami
- Alexander Feldman
- M. Enamul Amyeen
- John W. Sheppard
- Na Hong
- Erik Frisk
- Sasikumar Cherubal
Venues
- CoRR
- ITC
- VTS
- AMIA
- IEEE Access
- Sensors
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IEEE Trans. Computers
- IEEE Trans. Very Large Scale Integr. Syst.
- ATS
- IEEE Trans. Instrum. Meas.
- DAC
- BMC Medical Informatics Decis. Mak.
- ECAI
- Asian Test Symposium
- VLSI Design
- Commun. Stat. Simul. Comput.
- J. Am. Medical Informatics Assoc.
- Artif. Intell. Medicine
- EMBC
- Comput. Biol. Medicine
- Microelectron. Reliab.
- DATE
- J. Electron. Test.
- IEEE Trans. Ind. Electron.
- BIBM
- ETS
- ACC
- BMC Medical Imaging
- IET Comput. Digit. Tech.
- Medical Biol. Eng. Comput.
- MedInfo
- J. Biomed. Informatics
- AAAI
- IEEE Des. Test Comput.
- CDC
- DFT
- npj Digit. Medicine
- Comput. Math. Methods Medicine
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