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Multi-tone Testing of Linear and Nonlinear Analog Circuits Using Polynomial Coefficients.
Suraj Sindia
Virendra Singh
Vishwani D. Agrawal
Published in:
Asian Test Symposium (2009)
Keyphrases
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analog circuits
digital circuits
fault diagnosis
linear combination
wavelet packet transform
basis functions
neural network
data mining
genetic algorithm
artificial intelligence
pattern recognition
test cases
constraint satisfaction