An efficient architecture for accumulator-based test generation of SIC pairs.
Ioannis VoyiatzisCostas EfstathiouPublished in: Microelectron. J. (2010)
Keyphrases
- test generation
- test cases
- symbolic execution
- test sequences
- design automation
- data sets
- quality assurance
- static analysis
- pairwise
- management system
- hough transform
- software architecture
- mutation testing
- relational databases
- cooperative
- high quality
- decision trees
- test data generation
- information systems
- artificial intelligence
- databases