Bridging defects resistance in the metal layer of a CMOS process.

Rosa Rodríguez-Montañés E. M. J. G. Bruls Joan Figueras

Published in: J. Electron. Test. (1996)

Keyphrases

metal oxide
multi layer
x ray
website
defect classification
decision making
middle layer
application layer
learning environment
automated visual inspection
grain size
machine learning
data structure
bayesian networks
three dimensional
case study
information retrieval