High-Level Test Generation for VLSI.

Debashis Bhattacharya Brian T. Murray John P. Hayes

Published in: Computer (1989)

Keyphrases

test generation
high level
low level
test cases
test sequences
symbolic execution
design automation
signal processing
static analysis
quality assurance
vlsi design
software testing
mutation testing
source code
test data generation
object oriented
information technology
decision trees
real world
databases