Testable Path Delay Fault Cover for Sequential Circuits.

Angela Krstic Srimat T. Chakradhar Kwang-Ting Cheng

Published in: J. Inf. Sci. Eng. (2000)

Keyphrases

power dissipation
fault diagnosis
fault models
shortest path
high speed
fault detection
path length
analog circuits
low power
analog vlsi
multicast tree
path selection
high level synthesis
xml documents
quantum computing
multiple paths
failure modes
digital circuits
transmission line
endpoints
power consumption