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Selective Low-Care Coding: A Means for Test Data Compression in Circuits with Multiple Scan Chains.
Youhua Shi
Nozomu Togawa
Shinji Kimura
Masao Yanagisawa
Tatsuo Ohtsuki
Published in:
IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (2006)
Keyphrases
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test data
test cases
test set
training data
search based testing
training set
coding scheme
data compression
training samples
database systems
data sets
object oriented
semi supervised learning
high resolution
video coding
compression ratio
training and test data