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Test generation and verification for highly sequential circuits.
Abhijit Ghosh
Srinivas Devadas
A. Richard Newton
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1991)
Keyphrases
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test generation
symbolic execution
test cases
test sequences
design automation
software testing
high speed
static analysis
mutation testing
quality assurance
circuit design
database
machine learning
asynchronous circuits