Using SOM neural network for X-ray inspection of missing-bump defects in three-dimensional integration.
Guanglan LiaoPengfei ChenLi DuLei SuZhiping LiuZirong TangTielin ShiPublished in: Microelectron. Reliab. (2015)
Keyphrases
- x ray
- three dimensional
- som neural network
- medical imaging
- intraoperative
- self organizing maps
- digital x ray images
- x ray images
- ct scans
- electron microscopy
- projection images
- tomographic images
- region growing
- range images
- feature vectors
- electron microscope
- metal oxide
- computer tomography
- transmission electron microscopy
- cone beam
- dual energy
- neural network