Functional Test Generation For Digital Integrated Circuits Using A Genetic Algorithm.
Xiaoming YuAlessandro FinFranco FummiElizabeth M. RudnickPublished in: GECCO (2002)
Keyphrases
- integrated circuit
- test generation
- genetic algorithm
- test cases
- test sequences
- symbolic execution
- static analysis
- design automation
- built in self test
- software testing
- fitness function
- quality assurance
- evolutionary algorithm
- mutation testing
- metal oxide semiconductor
- simulated annealing
- test data generation
- code coverage
- hardware description language
- printed circuit boards
- x ray
- training data
- data sets