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Surface layer impurities on silicon spheres used in determination of the Avogadro constant.
Michael J. Kenny
Roger P. Netterfield
Leszek S. Wielunski
David Beaglehole
Published in:
IEEE Trans. Instrum. Meas. (1999)
Keyphrases
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silicon dioxide
space charge
si sio
surface reconstruction
d objects
multi layer
high temperature
three dimensional
low cost
high speed
application layer
high density
free form
shape index
surface fitting
leakage current