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Electrical characterization of metal-oxide-high-k dielectric-oxide-semiconductor (MOHOS) structures for memory applications.
Hsin-hao Hsu
Joseph Ya-min Lee
Published in:
Microelectron. Reliab. (2007)
Keyphrases
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metal oxide
electrical properties
silicon dioxide
x ray
solid state
high speed
gate insulator
field effect transistors
transmission line
si sio
random access
memory requirements
high density
flash memory
database
main memory
data warehouse