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High-Level Test Generation for Asynchronous Circuits from Signal Transition Graph.
Eunjung Oh
Soo-Hyun Kim
Dong-Ik Lee
Ho-Yong Choi
Published in:
IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (2002)
Keyphrases
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asynchronous circuits
test generation
high level
low level
test cases
test sequences
symbolic execution
design automation
process algebra
structured data
delay insensitive
high frequency
static analysis
quality assurance
model checking
mutation testing
image processing
software testing
web services