Using GA-SVM for defect inspection of flip chips based on vibration signals.
Ke LiLingyu WangJingjing WuQiuju ZhangGuanglan LiaoLei SuPublished in: Microelectron. Reliab. (2018)
Keyphrases
- defect detection
- vibration signal
- support vector
- support vector machine svm
- genetic algorithm
- condition monitoring
- support vector machine
- fault diagnosis
- feature vectors
- wavelet transform
- feature selection
- multi class
- fault detection
- operating conditions
- neural network
- denoising
- artificial neural networks
- training data
- high frequency
- morphological filters
- image segmentation
- artificial intelligence
- machine learning